 |
 |
Skip |  |
 |
|
FINAL SCHEDULE
- 10:30 - 10:45 - Welcome
- 10:45 - 11:15 - Keynote speech: Jitendra Malik, UC Berkeley, "The Hilbert Problems of Computer Vision"
- 11:15 - 11:30 - Thomas M. Breuel, PARC, Inc., "Discriminative Hierarchical Bayesian Models and Generalization in Visual Object Recognition"
- 11:30 - 11:45 - Stella Yu, UC Berkeley, "Computational Models of Perceptual Organization"
- 11:45 - 12:00 - James Davis, Honda Research Institute, "Spacetime Stereo : A Unifying Framework for Depth from Triangulation"
- 12:00 - 1:00 - Lunch
- 1:00 - 1:15 - Harlyn Baker, HP Labs, "Computation and Performance Issues In Coliseum, An Immersive Videoconferencing System"
- 1:15 - 1:30 - Eric Saund, PARC, Inc., "Pressing Vision Problems in Intelligent Sketch Understanding Systems"
- 1:30 - 1:45 - Greg Mori, UC Berkeley, "Recognizing Objects in Adversarial Clutter: Breaking a Visual CAPTCHA"
- 1:45 - 2:00 - Hailin Jin, Washington University, "Multi-view Stereo Beyond Lambert"
- 2:00 - 2:15 - Hai Tao, UC Santa Cruz, "Recent Research Progress in the Visual Computing Group"
- 2:15 - 2:40 - Coffee break
- 2:40 - 2:55 - James Coughlan, Smith-Kettlewell Eye Research Institute, "A Bayesian Network Framework for Relational Shape Matching"
- 2:55 - 3:10 - Roberto Manduchi, UC Santa Cruz, "The Bias/Variance Dilemma in Computer Vision"
- 3:10 - 3:25 - Alyosha Efros, UC Berkeley, "Recognizing Action at a Distance"
- 3:25 - 3:40 - Yacov Hel-Or (Tocky), IDC - HP Labs, "Fast Pattern Detection"
- 3:40 - 3:55 - Peyman Milanfar, UC Santa Cruz, "Some Recent Advances in Motion Estimation and Multiframe Resolution Enhancement"
- 3:55 - 4:10 - Jeff Mulligan, NASA AMES, "Opportunistic Head-Based Gaze Tracking"
- 4:10 - 4:25 - Tanveer Syeda-Mahmood, IBM Almaden Research Center, "Indexing and Retrieving Time-varying Gene Expression Databases"
- 4:25 - 4:40 - Michael Harville, HP Labs, "Multi-Person Tracking with Adaptive Plan-View Statistical Templates from Stereo Cameras" (paper)
- 4:40 - 4:55 - Yihong Gong, NEC, "Video Content Analysis Research at NEC Laboratories America"